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ECSEL 2018 RIA UltimateGaN ”SweGaN”

Reference number
Coordinator SweGaN AB
Funding from Vinnova SEK 3 066 354
Project duration May 2019 - April 2022
Status Completed
Venture ECSEL

Important results from the project

Most of the purpose and the goals have been addressed and fulfilled in the project.

Expected long term effects

1. Scaling the buffer-free GaN-on-SiC MOCVD process to 6’’ done. Improved epitaxial stacks to enhance the voltage blocking capability and to reduce the trapping 2. Built laser-based wafer slicing setup that cut and make line damage inside SiC bulk crystal. However, due to the limited laser performance, line damage cannot be well focused and controlled 3. New thermal surface polishing developed to achieve atomically flat SiC surface morphology 4. 4’’ 2cm-thick semi-insulating SiC crystal growth was developed. The SI property uniformity over the crystal needs to be further improved

Approach and implementation

The tasks of the research and development were well designed in a top-down approach. We divided the ultimate objective to many different tasks and milestones. They were conducted almost in parallel to be efficient and effective.

The project description has been provided by the project members themselves and the text has not been looked at by our editors.

Last updated 8 July 2022

Reference number 2019-02201