Purpose and goal
The Project will subject several sphalerite deposits to detailed multimodal, multi-scale and multi-dimensional characterization to develop in-depth understanding of the controls on the distribution of Ga, Ge and In and their implications for ore formation and processing. The project aims at establishing a new analytical workflow that can be used in exploration and characterization programs.
Expected effects and result
The results will be used to identify the most appropriate criteria and sensor technologies that can be implemented to enable in-depth characterization of Ga and Ge in exploration and beneficiation programs. This knowledge will enable a more sophisticated assessment of the byproduct potential for Ga, Ge and In in sulphide ores, thereby contributing to a more sustainable and effective resource utilization.
Planned approach and implementation
Several sphalerite deposits will be characterized in drill core and sampled for detailed characterization using SEM-BSE, SEM-CL, EBSD, LA-ICP-MS and X-ray computered tomography (XCT). Specific work packages will focus on integration of different datasets, geometallurgical implications and identification of relevant sensor technology for upscaling.
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